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Capturing transient structures in the elimination reaction of haloalkane in solution by transient X-ray diffraction

  • Hyuk Lee Jae
  • , Kyu Kim Tae
  • , Joonghan Kim
  • , Qingyu Kong
  • , Marco Cammarata
  • , Maciej Lorenc
  • , Michael Wulff
  • , Hyotcherl Ihee
  • Korea Advanced Institute of Science and Technology
  • Pusan National University
  • European Synchrotron Radiation Facility

Research output: Contribution to journalArticlepeer-review

57 Scopus citations

Abstract

This Communication reports simultaneous tracking of structural and kinetic information for the photoinduced elimination reaction of 1,2-diiodotetrafluoroethane in solution by transient X-ray diffraction. The transient structure of ·CF2CF2I is determined to be a classical mixture whereas ·CH2CH2I is bridged. Compared with the gas phase reaction, the secondary dissociation of ·CF2CF2I into C2F4 and I is slowed down by a factor of 6 in solution. Transient X-ray diffraction offers a complementary method for capturing transient structures in solution which might be invisible or "optically silent" in time-resolved optical spectroscopy.

Original languageEnglish
Pages (from-to)5834-5835
Number of pages2
JournalJournal of the American Chemical Society
Volume130
Issue number18
DOIs
StatePublished - 7 May 2008

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