Abstract
A study was performed on the selective growth of TiO2 thin films on a patterned Si(100) surface. The techniques used were metalorganic chemical vapor deposition and microcontact printing methods. The data obtained from Auger electron spectroscopy and x-ray diffraction analysis showed that the deposited TiO2 material was stoichiometric, polycrystalline, and consisted of anatase phase.
| Original language | English |
|---|---|
| Pages (from-to) | 1773-1776 |
| Number of pages | 4 |
| Journal | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
| Volume | 21 |
| Issue number | 4 |
| State | Published - Jul 2003 |
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